Scanning Probe Microscopy
Atomic Force Microscopy And Scanning Tunneling Microscopy
de Bert Voigtlander
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eBook
idioma: Inglês
Editor:
Springer Berlin Heidelberg
Edição:
fevereiro de 2015
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198,09€
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Sobre o livro
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
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Detalhes do produto
Scanning Probe Microscopy
Atomic Force Microscopy And Scanning Tunneling Microscopy
ISBN:
9783662452400
Ano de edição:
02-2015
Editor:
Springer Berlin Heidelberg
Idioma:
Inglês
Tipo de Produto:
eBook
Coleção:
Nanoscience And Technology
Formato:
PDF i
Classificação Temática: